Page 54 - 台電綜合研究所簡介About TPRI
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化檢組 Chemical Testing Section

           主要試驗內容 The Contents of Major Test
          。  電力系統各類物料-金屬、木材、塑膠及橡膠之製品等之化學成分與物理特性試驗
               Chemical and Physical Test for Materials of Electrical Power System-Metal, Wood, Plastic and
               Rubber
          。  各類水質及水處理材料特性分析
               Water and Water Treatment Materials Properties Analysis
          。  事業廢棄物溶出毒性試驗
               TCLP Testing for Industrial Waste
          。  固體廢棄物、毒性化學物質及相關之環境污染物分析檢驗
               Analysis of Solid Wastes、Toxic Chemicals and Related Environmental Pollutants
          。  金屬及工程材料機械特性檢驗
               Mechanical Property Test for Metal and Engineering Material
          。  電力器材金相及破損分析
               Metallographic and Fracture Analysis of Boiler and Related Steam-power-plant Equipment

           獲得的認證與資格 Accreditation and Qualification that We Got
          。  ISO/IEC 17025:2017;CNS 17025:2018
               ◼ 材料實驗室(TAF 證書編號:L1883-210915)
                 Material Laboratory(TAF Accreditation Number:L1883-210915)
          。  環境檢驗測定機構檢驗室品質系統基本規範
               ◼ 環境檢驗室(環保署許可字號:環署環檢字第零四三號)
                 Environmental Analysis Laboratory(NIEA Accreditation Number:043)
           主要試驗設備 Major Facility

          。  光譜分析儀-材料、環境樣品成分分析
               Spectroscopy-for Analysis of Chemical Composition of Material and Environmental
               Samples

          。  感應耦合電漿質譜儀-微量元素分析
               Inductively Coupled Plasma Mass Spectrometry-for Trace Elements Analysis

          。  氣相層析儀-物質定性定量分析
               Gas Chromatograph-for Qualitative and Quantitative Analysis of Material

          。  X 光繞射光譜儀-物質內部結構與組成分析
               X-ray Diffractometer-for Analyzing the Structure and Composition of a Material

          。  掃描式電子顯微鏡-金屬與非金屬材料微區顯微組織觀察,適用於電力器材之破損分析
               Scanning Electron Microscopy –Microstructure Observation of Metal and non-Metal
               Materials for Failure Analysis of Electrical Equipment


















                  感應耦合電漿質譜儀                              掃描式電子顯微鏡                         X 光繞射光譜儀
                        ICP-MS                     Scanning Electron Microscopy        X-ray Diffractometer

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